Allen, Jonathan; Wyatt, John L., Jr.; White, Jacob K.; Devadas, Srinivas; Chandrakasan, Anantha P.; Masaki, Ichiro; Armstrong, Robert C.; Baltus, Donald G.; Dynes, Scott B. C.; Ehrlich, Michael S.; McDonald, Robert G.; Tan, Chin Hwee; Horn, Berthold K. P.; Lee, Hae-Seung; Schmidt, Martin A.; Sodini, Charles G.; Bergendahl, Jason R.; Coram, Geoffrey J.; Decker, Steven J.; Gealow, Jeffrey C.; Martin, David R.; McQuirk, Ignacio S.; Yu, Paul C.; Hadjiyiannis, George I.; Hanono, Silvina Z.; Liao, Stan Y.; Engels, Daniel W.; Fallah, Farzan; Monteiro, José C.; Lumsdaine, Andrew; Reichelt, Mark W.; Rahmat, Khalid; Antoniadis, Dimitri A.; Aluru, Narayana R.; Kamon, Mattan; Senturia, Stephen D.; Phillips, Joel R.; van der Zant, Herre S. J.; Orlando, Terry P.; Chou, Michael T.; Massoud, Yehia M.; Nabors, Keith S.; Tausch, Johannes; Korsmeyer, F. Thomas; Elfadel, Ibrahim M.; Nastov, Ognen J.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1995-01-01)