Stevens, Kenneth N.; Perkell, Joseph S.; Shattuck-Hufnagel, Stefanie; Allen, Jonathan; Halle, Morris; Keyser, Samuel J.; Matthies, Melanie L.; Svirsky, Mario A.; Turk, Alice E.; Xu, Yi; Guiod, Peter C.; Hall, Seth M.; Manzella, Joyce; Barsukov, Vladimir M.; Bickley, Corine A.; Boyce, Suzanne E.; Espy-Wilson, Carol Y.; Goldhor, Richard S.; Hillman, Robert E.; Huang, Caroline B.; Lane, Harlan L.; Locke, John L.; Makhoul, John I.; Manuel, Sharon Y.; Pind, Jorgen; Wilhelms-Tricarico, Reiner; Williams, David R.; Basalo, Sergio; Esposito, Anna; Hanson, Helen M.; Holmberg, Eva B.; Mitchell, Clay T.; Wozniak, Jane W.; Chang, Hwa-Ping; Chen, Marilyn Y.; Chenausky, Karen; Horowitz, David M.; Johnson, Mark A.; Kuo, Hong-Kwang J.; Liu, Sharlene A.; Massey, Noel S.; Nguyen, Katerina; Poort, Kelly L.; Wilde, Lorin F.; Cheng, Howard; Dilley, Laura C.; Geng, Helena; Geoffroy, Brett A.; Hardy, John; Harker, Marnie L.; Lu, Henry; Mallin, Rebecca; Molinaar, Rachel; Sever, Laura M.; North, D. Keith; Wint, Arlene E.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1994-01-01)