Orlando, Terry P.; Trias, Enrique; Bock, Robert D.; Phillips, Joel R.; van der Zant, Herre S. J.; White, Jacob K.; Lee, Laurence H.; Lyons, W. Gregory; Delin, Kevin A.; Berman, David B.; Antoniadis, Dimitri A.; Hugunin, James J.; Smith, Henry I.; Burkhardt, Martin; Carter, David J.; Kumar, Arvind; Kleinsasser, A. W.; Receveur, Roger A. M.; Strongatz, Steven H.; Watanabe, Shinya; Duwel, Amy E.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1994-01-01)