Haus, Hermann A.; Ippen, Erich P.; Fujimoto, James G.; Hagelstein, Peter L.; Bouma, Brett E.; Izatt, Joseph A.; Doerr, Christopher R.; Nelson, Lynn E.; Tamura, Kohichi R.; Jones, David J.; Moores, John D.; Wong, William S.; Khatri, Farzana I.; Bergman, Keren; Boivin, Luc; Shirasaki, Matasaka; Kolodziejski, Leslie A.; Smith, Henry I.; Chen, Jerry C.; Damask, Jay N.; Ferrera, Juan; Khan, Mohammed Jalal; Lenz, Gadi; Dougherty, David J.; Hultgren, Charles T.; Fleischer, Siegfried B.; Darwish, Ali M.; Ramaswamy-Paye, Malini; Russell, Jeffrey; Sierra, Raymond; Keller, Ursula; Bilinsky, Igor P.; Golubovic, Boris; Ulman, Morrison; Sun, Chi-Kuang; Stanton, Christopher; Boppart, Stephen A.; Hee, Michael R.; Lin, Charles P.; Tearney, Guillermo J.; Swanson, Eric A.; Brezinski, Mark E.; Birngruber, Reginald; Toth, Cynthia A.; Cain, Clarance P.; Noojin, Gary D.; Roach, W. P.; DiCarlo, Cheryl D.; Goodberlet, James G.; Savas, Timothy A.; Fleury, Marc; Muendel, Martin H.; Kaushik, Sumanth (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1994-01-01)