Haus, Hermann A.; Ippen, Erich P.; Fujimoto, James G.; Hagelstein, Peter L.; Basu, Santanu; Paye, Jeróme M.; Khatri, Farzana I.; Lenz, Gadi; Moores, John D.; Nelson, Lynn E.; Doerr, Christopher R.; Tamura, Kohichi R.; Wong, William S.; Bergman, Keren; Boivin, Luc; Bounds, Jeffrey K.; Dougherty, David J.; Lyubomirsky, Ilya; Shirasaki, Matasaka; Kärtner, Franz X.; Damask, Jay N.; Khan, Mohammed Jalal; Kolodziejski, Leslie A.; Ferrera, Juan; Wong, Vincent V.; Smith, Henry I.; Darwish, Ali M.; Hall, Katherine L.; Hultgren, Charles T.; Cheng, Tak K.; Adams, Laura E.; Bouma, Brett E.; Gouvei-Neto, Artur D.; Huang, David; Ramaswamy, Malini; Ulman, Morrison; Acioli, Lucio H.; Izatt, Joseph A.; Bilinsky, Igor P.; Sun, Chi-Kuang; Boppart, Stephen A.; Hee, Michael R.; Tearney, Guillermo J.; Lin, Charles P.; Goodberlet, James G.; Muendel, Martin H.; Savas, Timothy A.; Fleury, Marc; Kaushik, Sumanth; Azzam, Ziad J.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1993-01-01)