X-Ray Scattering Spectroscopy
Citable URI:
http://hdl.handle.net/1721.1/56665
| Title: | X-Ray Scattering Spectroscopy |
| Author: | Birgeneau, Robert J. |
| Publisher: | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| Issue Date: | 1977-01 |
| Description: | Contains research objectives and summary of research on one research project. |
| URI: | http://hdl.handle.net/1721.1/56665 |
| Other Identifiers: | RLE_PR_119_VI |
| Is Part Of | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1977 General Physics X-Ray Scattering Spectroscopy |
| Series/Report no.: | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 119 |
| Keywords: | X-Ray Scattering Spectroscopy, High-Resolution X-Ray Scattering Spectroscopy of Condensed Matter |
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| Files | Size | Format | View | |
|---|---|---|---|---|
| RLE_PR_119_VI.pdf | 133.5Kb |
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