Stevens, Kenneth N.; Perkell, Joseph S.; Shattuck-Hufnagel, Stefanie; Allen, Jonathan; Halle, Morris; Keyser, Samuel J.; Bickley, Corine A.; Boyce, Suzanne E.; Espy-Wilson, Carol Y.; Huffman, Marie K.; Jackson, Michel T.; Matthies, Melanie L.; Randolph, Mark A.; Svirsky, Mario A.; Zue, Victor W.; Arman-Nassi, Giulia; Goldhor, Richard S.; Hillman, Robert E.; Hoit, Jeannette D.; Holmberg, Eva B.; Ichikawa, Tetsuo; Lane, Harlan L.; Locke, John L.; Makhoul, John I.; Ringo, Carol C.; Suzuki, Noriko; Webster, Jane W.; Alwan, Abeer A.; Chen, Marilyn Y.; Hanson, Helen M.; Howitt, Andrew William; Huang, Caroline B.; Wilde, Lorin F.; Rajan, Anita; Sandford, Lorraine; Trehan, Veena; Williams, Monnica J.; Forestell, Ann F.; Hall, Seth M.; North, D. Keith; Wint, Arlene E. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1990-01-01)