Allen, Jonathan; Wyatt, John L., Jr.; Devadas, Srinivas; White, Jacob K.; Armstrong, Robert C.; Baltus, Donald G.; Bamji, Cyrus S.; McCormick, Steven P.; Reichelt, Mark W.; Van Aelten, Filip J.; Horn, Berthold K. P.; Lee, Hae-Seung; Poggio, Tomaso; Sodini, Charles G.; Decker, Steven J.; Elfadel, Ibrahim M.; Hakkarainen, Mikko; Keast, Craig L.; McQuirk, Ignacio S.; Seidel, Mark N.; Standley, David L.; Umminger, Christopher B.; Yang, Woodward; Bryan, Michael J.; Chen, Curtis S.; Lam, Kevin; Lumsdaine, Andrew; Silveira, Luis M.; Lloyd, Jennifer A.; Phillips, Joel R.; Rahmat, Khalid; Antoniadis, Dimitri A.; Nabors, Keith S.; Telichevsky, Ricardo (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1989-01-01)