Bekefi, George; Bers, Abraham; Coppi, Bruno; Porkolab, Miklos; Betti, Riccardo; Detragiache, Paolo; Englade, Ronald C.; Luckhardt, Stanley C.; Migliuolo, Stefano; Ram, Abhay K.; Sugiyama, Linda E.; Wurtele, Jonathan S.; Conde, Manoel E.; de Graff, Christian E.; Stoner, Richard E.; DiRienzo, Anthony C.; Aalberts, Daniel P.; DiCecca, Salvatore; Xu, Kongyi; Leibovitch, Chaim; Jerby, Eli; Mastovsky, Ivan; Chen, Shien-Chi; Chow, Carson C.; Jablonski, Mark K.; Kupfer, Kenneth C.; Delcroix, Jean-Loup; Fuchs, Vladimir; Friedland, Lazar; Angelini, Sergio; Betti, Riccardo; Ehrnst, Darin; Nassi, Marco; Chen, Kuo-In; Coda, Stefano; Colborn, Jeffrey A.; Fitzgerald, Edward A.; Kirkwood, Robert J.; Leon, Alberto; Schroder, Kurt A.; Squire, Jared P.; Villasenor, Jesus Noel S. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1989-01-01)