Stevens, Kenneth N.; Perkell, Joseph S.; Shattuck-Hufnagel, Stefanie R.; Halle, Morris; Keyser, Samuel J.; Bickley, Corine A.; Boyce, Suzanne E.; Espy-Wilson, Carol Y.; Hall, Seth M.; Huffman, Marie K.; Manuel, Sharon Y.; Matthies, Melanie L.; Randolph, Mark A.; Chapin Ringo, Carol; Svirsky, Mario A.; Zue, Victor W.; Arman-Nassi, Giulia; Gilbert, Harvey R.; Goldhor, Richard S.; Hillman, Robert E.; Hoit, Jeannette D.; Holmberg, Eva B.; Koreman, Jacques; Lane, Harlan L.; Locke, John L.; Makhoul, John I.; Sen, Aniruddha; Sorokin, Victor N.; Sulter, Arend; Suzuki, Noriko; Webster, Jane W.; Alwan, Abeer A.; Chen, Marilyn Y.; Howitt, Andrew William; Huang, Caroline B.; Wilde, Lorin F.; Rajan, Anita; Sandford, Lorraine; Trehan, Veena; Forestell, Ann F.; Glicksman, Laura B.; Lugo, Sandra I.; North, D. Keith
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1989-01-01)