Kiang, Nelson Y-S.; Peake, William T.; Weiss, Thomas F.; Braida, Louis D.; Chase, Sheila M.; Colburn, H. Steven; Durlach, Nathaniel I.; Houtsma, Adrian J. M.; Lim, Jae S.; Rabinowitz, William M.; Reed, Charlotte M.; Burns, Edward M.; Gabriel, Kaigham J.; Hausler, Rudolph G.; Mills, Allen W.; Moss, Peter J.; Siebert, William M.; Siegel, Ronald A.; Stern, Richard M., Jr.; Clements, Mark A.; Coln, Michael C.; DeGennaro, Stephen V.; Dowdy, Leonard C.; Hicks, Bruce L.; Lippmann, Richard P.; Mook, Douglas R.; Norton, Susan J.; Peterson, Patrick M.; Picheny, Michael A.; Schultz, Martin C.; Villchur, Edgar; Perevoski, Ernest J.; Frishkopf, Lawrence S.; Oman, Charles M.; Kunin, Richard D.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1978-01)