Bers, Abraham; Johnston, George L.; Sen, Abhijit; Leclert, Gérard P.; Krapchev, Vladimir B.; Reiman, Allan H.; Karney, Charles F. F.; Fisch, Nathaniel J.; Edwards, Bruce E.; Macrakis, Stavros M.; Politzer, Peter A.; Shanfield, Stanley R.; Hershcovitch, Ady; Lidsky, Lawrence M.; Dupree, Thomas H.; Bekefi, George; Coppi, Bruno; McCune, James E.; Fisher, Jay L.; Hastings, Daniel E.; Rubenstein, Kenneth; Svolos, George M.; Kulp, John L., Jr.; Tekula, Miloslav S.; Theilhaber, Kim S.; Tetreault, David J.; Deutsch, Claude; Porkolab, Miklos; Smullin, Louis D.; Klinkowstein, Robert E.; Mauel, Michael E.; Kenyon, Peter T.; Breen, Barry N.; McKinstry, Mark L.; Thomas, Clarence E.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1978-01)