Allen, Jonathan; Armstrong, Robert C.; Baltus, Donald G.; Bamji, Cyrus S.; McCormick, Lynne M.; McCormick, Steven P.; Miyanaga, Hiroshi; Reichelt, Mark W.; Van Aelten, Filip J.; Musicus, Bruce R.; Prasanna, G. N. Srinivasa; Sikes, Bennet; Song, William S.; Fogg, Dennis C. Y.; Olsen, James A.; Peterson, Kevin; Feder, Meir; Weinstein, Ehud; Wyatt, John L., Jr.; Horn, Berthold K. P.; Lee, Hae-Seung; Poggio, Tomaso; Sodini, Charles G.; Keast, Craig L.; Elfadel, Ibrahim M.; Hakkarainen, Mikko; Standley, David L.; McQuirk, Ignacio S.; Umminger, Christopher B.; Young, Woodward; Devadas, Srinivas; White, Jacob K.; Lumsdaine, Andrew; Lloyd, Jennifer A.; Antoniadis, Dimitri A.; Nabors, Keith S.; Silviera, Luis M.; Telichevsky, Ricardo (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1988-01-01)