Dreher, John H.; Burke, Bernard F.; Carilli, Christopher; Hewitt, Jacqueline N.; Langston, Glen; Heflin, Michael B.; Connor, Samuel; Dhawan, Vivek; Barrett, John W.; Staelin, David H.; Shao, Michael; Hines, Braden E.; Kim, Edward J.; Rosenkranz, Phillip W.; Kuo, Charlene C.; Bonanni, Pierino G.; Gasiewski, Albin J.; Zanciewicz, Gregory J.; Malvar, Henrique S.; Brofferio, Sergio; Preisig, James C.; Shapiro, Jerome S.; Szabo, Bernard I.; Wornell, Gregory W.; Cheung, Shiufun; Irving, William I.; Lum, Gordon M.; Medard, Muriel; Arias, Tomas A.; Hammerschlag, Roeland V.; Eikenberry, Stephen S.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1987-01-01)