Bekefi, George; Porkolab, Miklos; Chen, Kuo-in; Luckhardt, Stanley C.; Bers, Abraham; Cairns, R. Alan; Fuchs, Vladimir; Hizanidis, Kyriakos; Ram, Abhay K.; Francis, Gregory; Harten, Leo P.; Coppi, Bruno; Dupree, Thomas H.; Lidsky, Lawrence M.; McCune, James E.; Smullin, Louis D.; Berman, Robert H.; Bonoli, P. T.; Englade, Ronald C.; Irby, James H.; Levine, J. S.; Migliuolo, S.; Ramos, J. J.; Shefer, R. E.; Sugiyama, Linda E.; Tetreault, David J.; Fitzgerald, E. W.; Mastovsky, Ivan; Xue, M.-L.; Aspinall, J. G.; Cavoulacos, P. E.; Fajans, J.; Foord, M. E.; Garner, Richard C.; Hamza, A. M.; Hartemann, F.; Humphreys, D. A.; Jacobs, K. D.; Kanapathipillai, M.; Kaplan, R. D.; Kirkpatrick, Desmond A.; LaBombard, B. L.; Marable, W. P.; Martinell, J. J.; Mayberry, M. J.; Pachtman, A.; Pu, Yi-Kang; Rappaport, Carey M.; Rohatgi, R. R.; Rowley, S. E.; Thayer, D. R.; Villasenor, Jesus Noel S.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1986-01)