Bers, Abraham; Berman, Robert H.; Ko, Kwok C.; Krapchev, Vladimir B.; Ram, Abhay K.; Theilhaber, Kim S.; Villalon, Maria Elena; Dupree, Thomas H.; Bekefi, George; Coppi, Bruno; McCune, James E.; Hastings, Daniel E.; Svolos, George M.; Fuchs, Vladimir; Harten, Leo P.; Tetreault, David J.; Kulp, John L., Jr.; Porkolab, Miklos; Chen, Kuo-in; Luckhardt, Stanley C.; Smullin, Louis D.; Klinkowstein, Robert E.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1980-01)