Kiang, Nelson Y-S.; Peake, William T.; Weiss, Thomas F.; Braida, Louis D.; Colburn, H. Steven; Durlach, Nathaniel I.; Houtsma, Adrian J. M.; Florentine, Mary S.; Reed, Charlotte M.; Uchanski, Rosalie M.; Gabriel, Kaigham J.; Freeman, Dennis M.; Gallagher, David T.; Giordano, Louis V.; Hausler, Rudolf G.; Ito, Yoshiko; Jaffee, Esther K.; Moss, Peter J.; Russell, Roy P., Jr.; Schaefer, Mark E.; Siegel, Ronald A.; Thompson, Carl L.; Chen, Francine R.; Coln, Michael C.; DeGennaro, Steven V.; Hicks, Bruce L.; Milner, Paul; Peterson, Patrick M.; Picheny, Michael A.; Schultz, Kenneth I.; Sotomayor-Diaz, Orlando; Villchur, Edgar; Boduch, Raymond; Bustamante, Diane K.; Chomsky, Carol; Coker, Jackie; Dowdy, Leonard C.; Conway-Fithian, Sue; Garrett, Merrill F.; Rabinowitz, William M.; Rubin, Steven I.; Schultz, Martin C.; Frishkopf, Lawrence S.; Oman, Charles M.; Kunin, Richard D.; Marcus, Edward N.; Siebert, William M. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1980-01)