Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices
Citable URI:
http://hdl.handle.net/1721.1/57016
| Title: | Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices |
| Author: | Kastner, Marc A.; Field, Stuart B.; Scott-Thomas, John H. F.; Meirav, Udi; Park, Samuel L. |
| Publisher: | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| Issue Date: | 1987-01-01 |
| Description: | Contains project goals. |
| URI: | http://hdl.handle.net/1721.1/57016 |
| Other Identifiers: | RLE_PR_130_11 |
| Is Part Of | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1987 Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices |
| Series/Report no.: | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 130 |
| Keywords: | Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices |
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| Files | Size | Format | View | |
|---|---|---|---|---|
| RLE_PR_130_11.pdf | 2.151Mb |
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