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Semiconductor Surface Studies

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Semiconductor Surface Studies

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Author: Joannopoulos, John D.; Kaxiras, Efthimios; Alerhand, Oscar L.; Arias, Tomas A.; Needels, Mark F.; Rappe, Andrew M.; Tarnow, Eugen G.; Wang, Jing
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Date Issued: 1988-01-01
Description:
Contains research summary and reports on two research projects.
URI: http://hdl.handle.net/1721.1/57085
Other Identifiers: RLE_PR_131_01_03s_03
Is Part Of: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1988
Solid State Physics, Electronics And Optics
Surfaces and Intersurfaces
Semiconductor Surface Studies
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 131
Keywords: Semiconductor Surface Studies, Ground State Geometries of Surfaces, Hydrogenation

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