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Semiconductor Surface Studies

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Semiconductor Surface Studies

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Author: Joannopoulos, John D.; Kaxiras, Efthimios; Alerhand, Oscar L.; Meade, Robert D.; Arias, Tomas A.; Cho, Kyeongjae; Needels, Mark F.; Rappe, Andrew M.; Wang, Jing
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Date Issued: 1990-01-01
Description:
Contains an introduction and reports on two research projects.
URI: http://hdl.handle.net/1721.1/57152
Other Identifiers: RLE_PR_133_01_03s_03
Is Part Of: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1990
Solid State Physics, Electronics and Optics
Surfaces and Interfaces
Semiconductor Surface Studies
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 133
Keywords: Semiconductor Surface Studies, Microscopic Model of Heteroepitaxy, Finite Temperature Phase Diagram of Vicinal Si(100)

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