Microstructural Evolution in Thin Films of Electronic Materials

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Microstructural Evolution in Thin Films of Electronic Materials

Author: Thompson, Carl V.; Longworth, Hai P.; Kahn, Harold; Walton, Derek T.; Frost, Harold J.; Joo, Young-Chang; Knowlton, Brett D.; Floro, Jerrold A.; Carel, Roland; Bristowe, Paul D.; Inglefield, Heather E.; Bogomolov, Sergei; Ballentine, Craig; O'Handley, Robert C.; Ma, En; Miura, Hideo; Uda, Takauki; Della Ratta, Anthony D.; Ro, Jaesang; Dubner, Andrew D.; Wagner, A.; Melngailis, John

Citable URI: http://hdl.handle.net/1721.1/57173

Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)

Date Issued: 1991-01-01

Description:

Contains reports on five research projects and a list of publications and theses.

URI: http://hdl.handle.net/1721.1/57173

Other Identifiers: RLE_PR_134_01_01s_05

Is Part Of: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1991
Solid State Physics, Electronics and Optics
Materials and Fabrication
Microstructural Evolution in Thin Films of Electronic Materials

Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 134

Keywords: Microstructural Evolution in Thin Films of Electronic Materials, Electromigration, Microstructure, Microstructural Evolution in Polycrystalline Films, Magnetic Properties of Heteroepitaxial Thin Films, Interface Reactions in Multilayer Thin Films, Focused Ion Beam Induced Chemical Vapor Deposition

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