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Semiconductor Surface Studies

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Semiconductor Surface Studies

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Author: Joannopoulos, John D.; Dal Pino, Arnaldo; Meade, Robert D.; Arias, Tomas A.; Cho, Kyeongjae; Rappe, Andrew M.; Wang, Jing; Ariel, Imadiel
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Date Issued: 1992-01-01
Description:
Contains an introduction, reports on two research projects and a list of publications.
URI: http://hdl.handle.net/1721.1/57208
Other Identifiers: RLE_PR_135_01_04s_04
Is Part Of: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1992
Solid State Physics, Electronics and Optics
Surfaces and Interfaces
Semiconductor Surface Studies
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 135
Keywords: Semiconductor Surface Studies, Surface Reconstruction, Computation at Large Length Scales

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