Synchrotron X-Ray Studies of Surface Disordering
Citable URI:
http://hdl.handle.net/1721.1/57231
| Title: | Synchrotron X-Ray Studies of Surface Disordering |
| Author: | Birgeneau, Robert J.; Blum, Kenneth I.; Noh, Do-Young; Nuttall, William J.; Ramstad, Monte J.; McCaffery, Elizabeth M. |
| Publisher: | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| Issue Date: | 1992-01-01 |
| Description: | Contains an introduction and reports on three research projects. |
| URI: | http://hdl.handle.net/1721.1/57231 |
| Other Identifiers: | RLE_PR_135_01_04s_02 |
| Is Part Of | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1992 Solid State Physics, Electronics and Optics Surfaces and Interfaces Synchrotron X-Ray Studies of Surface Disordering |
| Series/Report no.: | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 135 |
| Keywords: | Synchrotron X-Ray Studies of Surface Disordering, Metal Surfaces Studies, Semiconductor Surface Studies, Model Surface Overlayers |
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| Files | Size | Format | View | |
|---|---|---|---|---|
| RLE_PR_135_01_04s_02.pdf | 1.716Mb |
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