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Synchrotron X-Ray Studies of Surface Disordering

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Synchrotron X-Ray Studies of Surface Disordering

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Author: Birgeneau, Robert J.; Wells, Barry; Ramstad, Monte J.; Young, Michael J.; Harring, Debra L.
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Date Issued: 1993-01-01
Description:
Contains an introduction, reports on three research projects and a list of publications.
URI: http://hdl.handle.net/1721.1/57273
Other Identifiers: RLE_PR_136_01_04s_02
Is Part Of: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1993
Solid State Physics, Electronics and Optics
Surfaces and Interfaces
Synchrotron X-Ray Studies of Surface Disordering
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 136
Keywords: Synchrotron X-Ray Studies of Surface Disordering, Vicinal Semiconductor Surfaces, Chiral Melting of the Si(113) (3x1) Reconstruction, Two-Dimensional Melting

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