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Single-Electron Spectroscopy

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Title: Single-Electron Spectroscopy
Author: Ashoori, Raymond C.; Chan, Ho-Bun; Berman, David B.; Brodsky, Mikhail G.; Heemeyer, Sven; Folch, Albert
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Issue Date: 1994-01-01
Description: Contains research goals and objectives, reports on four research projects and a list of publications.
URI: http://hdl.handle.net/1721.1/57302
Other Identifiers: RLE_PR_137_01_02s_06
Is Part Of Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1994
Solid State Physics, Electronics and Optics
Quantum-Effect Devices
Single-Electron Spectroscopy
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 137
Keywords: Single-Electron Spectroscopy, Traps Created by Disorder in Semiconductor Structures, Traps Created by Impurities in Semiconductor Structures, Artificial Atoms, Spatially Resolved Charge Sensing, Single-Electron Transistors for Spectroscopy

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