Single-Electron Spectroscopy

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Single-Electron Spectroscopy

Author: Ashoori, Raymond C.; Chan, Ho-Bun; Berman, David B.; Brodsky, Mikhail G.; Heemeyer, Sven; Folch, Albert

Citable URI: http://hdl.handle.net/1721.1/57302

Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)

Date Issued: 1994-01-01

Description:

Contains research goals and objectives, reports on four research projects and a list of publications.

URI: http://hdl.handle.net/1721.1/57302

Other Identifiers: RLE_PR_137_01_02s_06

Is Part Of: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1994
Solid State Physics, Electronics and Optics
Quantum-Effect Devices
Single-Electron Spectroscopy

Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 137

Keywords: Single-Electron Spectroscopy, Traps Created by Disorder in Semiconductor Structures, Traps Created by Impurities in Semiconductor Structures, Artificial Atoms, Spatially Resolved Charge Sensing, Single-Electron Transistors for Spectroscopy

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