Semiconductor Surface Studies

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dc.contributor.author	Joannopoulos, John D.	en_US
dc.contributor.author	Arias, Tomas A.	en_US
dc.contributor.author	Brommer, Karl	en_US
dc.contributor.author	Capaz, Rodrigo B.	en_US
dc.contributor.author	Cho, Kyeongjae	en_US
dc.contributor.author	Ariel, Imadiel	en_US
dc.date.accessioned	2010-07-16T20:37:56Z
dc.date.available	2010-07-16T20:37:56Z
dc.date.issued	1994-01-01 to 1994-12-31	en_US
dc.identifier	RLE_PR_137_01_04s_02	en_US
dc.identifier.uri	http://hdl.handle.net/1721.1/57315
dc.description	Contains an introduction, reports on two research projects and a list of publications.	en_US
dc.description.sponsorship	Joint Services Electronics Program Contract DAAL03-92-C-0001	en_US
dc.description.sponsorship	Joint Services Electronics Program Grant DAAH04-95-1-0038	en_US
dc.language.iso	en	en_US
dc.publisher	Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)	en_US
dc.relation.ispartof	Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1994	en_US
dc.relation.ispartof	Solid State Physics, Electronics and Optics	en_US
dc.relation.ispartof	Surfaces and Interfaces	en_US
dc.relation.ispartof	Semiconductor Surface Studies	en_US
dc.relation.ispartofseries	Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 137	en_US
dc.rights	Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.	en_US
dc.subject.other	Semiconductor Surface Studies	en_US
dc.subject.other	Chemisorption	en_US
dc.subject.other	Cross-sectional Scanning Tunneling Microscopy	en_US
dc.title	Semiconductor Surface Studies	en_US
dc.type	Technical Report	en_US