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Semiconductor Surface Studies

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dc.contributor.author Joannopoulos, John D. en_US
dc.contributor.author Arias, Tomas A. en_US
dc.contributor.author Brommer, Karl en_US
dc.contributor.author Capaz, Rodrigo B. en_US
dc.contributor.author Cho, Kyeongjae en_US
dc.contributor.author Ariel, Imadiel en_US
dc.date.accessioned 2010-07-16T20:37:56Z
dc.date.available 2010-07-16T20:37:56Z
dc.date.issued 1994-01-01 to 1994-12-31 en_US
dc.identifier RLE_PR_137_01_04s_02 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/57315
dc.description Contains an introduction, reports on two research projects and a list of publications. en_US
dc.description.sponsorship Joint Services Electronics Program Contract DAAL03-92-C-0001 en_US
dc.description.sponsorship Joint Services Electronics Program Grant DAAH04-95-1-0038 en_US
dc.language.iso en en_US
dc.publisher Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) en_US
dc.relation.ispartof Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1994 en_US
dc.relation.ispartof Solid State Physics, Electronics and Optics en_US
dc.relation.ispartof Surfaces and Interfaces en_US
dc.relation.ispartof Semiconductor Surface Studies en_US
dc.relation.ispartofseries Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 137 en_US
dc.rights Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. en_US
dc.subject.other Semiconductor Surface Studies en_US
dc.subject.other Chemisorption en_US
dc.subject.other Cross-sectional Scanning Tunneling Microscopy en_US
dc.title Semiconductor Surface Studies en_US
dc.type Technical Report en_US


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