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Noise analysis for comparator-based circuits

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Show simple item record Sepke, Todd Holloway, Peter Sodini, Charles G. Lee, Hae-Seung 2011-03-10T21:58:45Z 2011-03-10T21:58:45Z 2009-03 2008-03
dc.identifier.issn 1549-8328
dc.identifier.other INSPEC Accession Number: 10543363
dc.description.abstract Noise analysis for comparator-based circuits is presented. The goal is to gain insight into the different sources of noise in these circuits for design purposes. After the general analysis techniques are established, they are applied to different noise sources in the comparator-based switched-capacitor pipeline analog-to-digital converter (ADC). The results show that the noise from the virtual ground threshold detection comparator dominates the overall ADC noise performance. The noise from the charging current can also be significant, depending on the size of the capacitors used, but the contribution was small in the prototype. The other noise sources have contributions comparable to those in op-amp-based designs, and their effects can be managed through appropriate design. In the prototype, folded flicker noise was found to be a significant contributor to the broadband noise because the flicker noise of the comparator extends beyond the Nyquist rate of the converter. en_US
dc.description.sponsorship National Semiconductor Corporation en_US
dc.language.iso en_US
dc.publisher Institute of Electrical and Electronics Engineers en_US
dc.relation.isversionof en_US
dc.rights Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. en_US
dc.source IEEE en_US
dc.title Noise analysis for comparator-based circuits en_US
dc.type Article en_US
dc.identifier.citation Sepke, T. et al. “Noise Analysis for Comparator-Based Circuits.” Circuits and Systems I: Regular Papers, IEEE Transactions on 56.3 (2009): 541-553. © 2009 IEEE. en_US
dc.contributor.department Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science en_US
dc.contributor.approver Lee, Hae-Seung
dc.contributor.mitauthor Lee, Hae-Seung
dc.contributor.mitauthor Sodini, Charles G.
dc.contributor.mitauthor Sepke, Todd
dc.relation.journal IEEE Transactions on Circuits and Systems I: Regular Papers en_US
dc.identifier.mitlicense PUBLISHER_POLICY en_US
dc.eprint.version Final published version en_US
dc.type.uri en_US
dspace.orderedauthors Sepke, T.; Holloway, P.; Sodini, C.G.; Lee, H.-S. en

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