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Ultrafast Photocurrent Measurement of the Escape Time of Electrons and Holes from Carbon Nanotube p-i-n Photodiodes

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dc.contributor.author Gabor, Nathaniel M.
dc.contributor.author Zhong, Zhaohui
dc.contributor.author Bosnick, Ken
dc.contributor.author McEuen, Paul L.
dc.date.accessioned 2012-07-06T18:24:15Z
dc.date.available 2012-07-06T18:24:15Z
dc.date.issued 2012-02
dc.date.submitted 2011-08
dc.identifier.issn 0031-9007
dc.identifier.issn 1079-7114
dc.identifier.uri http://hdl.handle.net/1721.1/71545
dc.description.abstract Ultrafast photocurrent measurements are performed on individual carbon nanotube p-i-n photodiodes. The photocurrent response to subpicosecond pulses separated by a variable time delay Δt shows strong photocurrent suppression when two pulses overlap (Δt=0). The picosecond-scale decay time of photocurrent suppression scales inversely with the applied bias VSD, and is twice as long for photon energy above the second subband E[subscript 22] as compared to lower energy. The observed photocurrent behavior is well described by an escape time model that accounts for carrier effective mass. en_US
dc.language.iso en_US
dc.publisher American Physical Society en_US
dc.relation.isversionof http://dx.doi.org/10.1103/PhysRevLett.108.087404 en_US
dc.rights Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. en_US
dc.source APS en_US
dc.title Ultrafast Photocurrent Measurement of the Escape Time of Electrons and Holes from Carbon Nanotube p-i-n Photodiodes en_US
dc.type Article en_US
dc.identifier.citation Nathaniel M. Gabor et al. "Ultrafast Photocurrent Measurement of the Escape Time of Electrons and Holes from Carbon Nanotube p-i-n Photodiodes" Physical Review Letters 108, 087404 (2012). © 2012 American Physical Society en_US
dc.contributor.department Massachusetts Institute of Technology. Department of Physics en_US
dc.contributor.approver Gabor, Nathaniel M.
dc.contributor.mitauthor Gabor, Nathaniel M.
dc.relation.journal Physical Review Letters en_US
dc.identifier.mitlicense PUBLISHER_POLICY en_US
dc.eprint.version Final published version en_US
dc.type.uri http://purl.org/eprint/type/JournalArticle en_US
eprint.status http://purl.org/eprint/status/PeerReviewed en_US
dspace.orderedauthors Gabor, Nathaniel; Zhong, Zhaohui; Bosnick, Ken; McEuen, Paul en


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