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A Comparison Of Scattering From 2-D And 3-D Rough Interface

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dc.contributor.author Cheng, Ningya
dc.contributor.author Schultz, Craig A.
dc.contributor.author Toksoz, M. Nafi
dc.contributor.other Massachusetts Institute of Technology. Earth Resources Laboratory en_US
dc.date.accessioned 2012-12-05T20:40:01Z
dc.date.available 2012-12-05T20:40:01Z
dc.date.issued 1995
dc.identifier.uri http://hdl.handle.net/1721.1/75257
dc.description.abstract In this paper we compared scattered waves from 2-D and 3-D interface structures. The modeling technique is the 3-D time domain finite difference method. The scheme is second-order accurate in time and fourth-order accurate in space. It is implemented on a massively parallel nCUBE computer. In order to investigate the characteristics of 2-D and 3-D rough surface scattering, we consider an acoustic-elastic boundary, which is described by a Gaussian autocorrelation function. The F-K analysis of reflected signals shows that 2-D scattering generates similar amounts of forward and back scattering, while in the 3-D case, more forward and less back scattering. The 3-D effects also show larger reflected energy than the 2-D case, especially near the normal incident. The out-of-plane scatterings are clearly demonstrated on the F-K spectra in the 3-D case. In the 2-D simulations, we have to keep in mind that it tends to overestimate the amount of backscattering energy. en_US
dc.description.sponsorship ERL/nCUBE Geophysical Center for Parallel Processing en_US
dc.description.sponsorship United States. Air Force Office of Scientific Research (Contract F49620-941-0282) en_US
dc.publisher Massachusetts Institute of Technology. Earth Resources Laboratory en_US
dc.relation.ispartofseries Earth Resources Laboratory Industry Consortia Annual Report;1995-10
dc.title A Comparison Of Scattering From 2-D And 3-D Rough Interface en_US
dc.type Technical Report en_US
dc.contributor.mitauthor Cheng, Ningya
dc.contributor.mitauthor Toksoz, M. Nafi
dspace.orderedauthors Cheng, Ningya; Schultz, Craig A.; Toksoz, M. Nafi en_US


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