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Impulse breakdown delay in liquid dielectrics

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dc.contributor.author Jadidian, Jouya
dc.contributor.author Zahn, Markus
dc.contributor.author Lavesson, Nils
dc.contributor.author Widlund, Ola
dc.contributor.author Borg, Karl
dc.date.accessioned 2013-06-27T18:41:02Z
dc.date.available 2013-06-27T18:41:02Z
dc.date.issued 2012-05
dc.date.submitted 2012-03
dc.identifier.issn 00036951
dc.identifier.issn 1077-3118
dc.identifier.uri http://hdl.handle.net/1721.1/79377
dc.description.abstract Theoretical images of streamers, revealing the mechanisms behind impulse breakdown in liquid dielectrics, are presented. Streamers lead to electrical breakdown by forming paths, capable of carrying large current amplitudes between electrodes. Breakdown delays and terminal currents are calculated for various electrode geometries (40 μm needle and 6.35 mm sphere) and gap distances (up to 10 mm). Modeling results indicate that the breakdown in needle-needle electrodes requires higher impulse voltage amplitudes than in needle-sphere electrodes for the same gap distances. Streamers in needle-sphere geometries are about 50% thicker than streamers propagating in needle-needle geometries under similar impulse voltage amplitudes. en_US
dc.description.sponsorship ABB Corporate Research Center (Vasteras, Sweden) en_US
dc.description.sponsorship IEEE Dielectrics and Electrical Insulation Society (Fellowship) en_US
dc.language.iso en_US
dc.publisher American Institute of Physics en_US
dc.relation.isversionof http://dx.doi.org/10.1063/1.4716464 en_US
dc.rights Creative Commons Attribution-Noncommercial-Share Alike 3.0 en_US
dc.rights.uri http://creativecommons.org/licenses/by-nc-sa/3.0/ en_US
dc.source Jouya Jadidian en_US
dc.title Impulse breakdown delay in liquid dielectrics en_US
dc.type Article en_US
dc.identifier.citation Jadidian, Jouya, Markus Zahn, Nils Lavesson, Ola Widlund, and Karl Borg. Impulse Breakdown Delay in Liquid Dielectrics. Applied Physics Letters 100, no. 19 (2012): 192910. en_US
dc.contributor.department Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science en_US
dc.contributor.approver Jadidian, Jouya en_US
dc.contributor.mitauthor Jadidian, Jouya en_US
dc.contributor.mitauthor Zahn, Markus en_US
dc.relation.journal Applied Physics Letters en_US
dc.identifier.mitlicense OPEN_ACCESS_POLICY en_US
dc.eprint.version Original manuscript en_US
dc.type.uri http://purl.org/eprint/type/JournalArticle en_US
eprint.status http://purl.org/eprint/status/NonPeerReviewed en_US
dspace.orderedauthors Jadidian, Jouya; Zahn, Markus; Lavesson, Nils; Widlund, Ola; Borg, Karl en_US
dc.identifier.orcid https://orcid.org/0000-0003-2228-2347


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Creative Commons Attribution-Noncommercial-Share Alike 3.0 Except where otherwise noted, this item's license is described as Creative Commons Attribution-Noncommercial-Share Alike 3.0
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