A new mechanical characterization method for thin film microactuators and its application to NiTiCu shape memory alloy

dc.contributor.advisor	Subra Suresh.	en_US
dc.contributor.author	Seward, Kirk P. (Kirk Patrick), 1975-	en_US
dc.date.accessioned	2005-08-22T18:15:59Z
dc.date.available	2005-08-22T18:15:59Z
dc.date.copyright	1999	en_US
dc.date.issued	1999	en_US
dc.identifier.uri	http://hdl.handle.net/1721.1/9425
dc.description	Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1999.	en_US
dc.description	Includes bibliographical references (p. 79-80).	en_US
dc.description.statementofresponsibility	by Kirk P. Seward.	en_US
dc.format.extent	80 p.	en_US
dc.format.extent	6611522 bytes
dc.format.extent	6611279 bytes
dc.format.mimetype	application/pdf
dc.format.mimetype	application/pdf
dc.language.iso	eng	en_US
dc.publisher	Massachusetts Institute of Technology	en_US
dc.rights	M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.	en_US
dc.rights.uri	http://dspace.mit.edu/handle/1721.1/7582
dc.subject	Mechanical Engineering	en_US
dc.title	A new mechanical characterization method for thin film microactuators and its application to NiTiCu shape memory alloy	en_US
dc.type	Thesis	en_US
dc.description.degree	S.M.	en_US
dc.contributor.department	Massachusetts Institute of Technology. Dept. of Mechanical Engineering	en_US
dc.identifier.oclc	43324718	en_US