dc.contributor.author | Siah, Sin Cheng | |
dc.contributor.author | Lee, Sang Woon | |
dc.contributor.author | Lee, Yun Seog | |
dc.contributor.author | Heo, Jaeyeong | |
dc.contributor.author | Shibata, Tomohiro | |
dc.contributor.author | Segre, Carlo U. | |
dc.contributor.author | Gordon, Roy G. | |
dc.contributor.author | Buonassisi, Tonio | |
dc.date.accessioned | 2015-06-09T15:06:21Z | |
dc.date.available | 2015-06-09T15:06:21Z | |
dc.date.issued | 2014-06 | |
dc.date.submitted | 2014-04 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.issn | 1077-3118 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/97238 | |
dc.description.abstract | We investigate the correlation between the atomic structures of amorphous zinc-tin-oxide (a-ZTO) thin films grown by atomic layer deposition (ALD) and their electronic transport properties. We perform synchrotron-based X-ray absorption spectroscopy at the K-edges of Zn and Sn with varying [Zn]/[Sn] compositions in a-ZTO thin films. In extended X-ray absorption fine structure (EXAFS) measurements, signal attenuation from higher-order shells confirms the amorphous structure of a-ZTO thin films. Both quantitative EXAFS modeling and X-ray absorption near edge spectroscopy (XANES) reveal that structural disorder around Zn atoms increases with increasing [Sn]. Field- and Hall-effect mobilities are observed to decrease with increasing structural disorder around Zn atoms, suggesting that the degradation in electron mobility may be correlated with structural changes. | en_US |
dc.description.sponsorship | United States. Office of Naval Research (ONR N00014-10-1-0937) | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (Award CBET-1032955) | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (CAREER Award ECCS-1150878) | en_US |
dc.language.iso | en_US | |
dc.publisher | American Institute of Physics (AIP) | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1063/1.4884115 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | Other univ. web domain | en_US |
dc.title | X-ray absorption spectroscopy elucidates the impact of structural disorder on electron mobility in amorphous zinc-tin-oxide thin films | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Siah, Sin Cheng, Sang Woon Lee, Yun Seog Lee, Jaeyeong Heo, Tomohiro Shibata, Carlo U. Segre, Roy G. Gordon, and Tonio Buonassisi. “X-Ray Absorption Spectroscopy Elucidates the Impact of Structural Disorder on Electron Mobility in Amorphous Zinc-Tin-Oxide Thin Films.” Appl. Phys. Lett. 104, no. 24 (June 16, 2014): 242113. © 2014 AIP Publishing LLC | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Photovoltaic Research Laboratory | en_US |
dc.contributor.mitauthor | Siah, Sin Cheng | en_US |
dc.contributor.mitauthor | Lee, Yun Seog | en_US |
dc.contributor.mitauthor | Buonassisi, Tonio | en_US |
dc.relation.journal | Applied Physics Letters | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Siah, Sin Cheng; Lee, Sang Woon; Lee, Yun Seog; Heo, Jaeyeong; Shibata, Tomohiro; Segre, Carlo U.; Gordon, Roy G.; Buonassisi, Tonio | en_US |
dc.identifier.orcid | https://orcid.org/0000-0001-8345-4937 | |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |