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Reduction of process monitoring in semiconductor chip manufacturing

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Reduction of process monitoring in semiconductor chip manufacturing

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Author: Amar, Ajay, 1964-
Department: Sloan School of Management; Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science
Publisher: Massachusetts Institute of Technology
Date Issued: 1999
Description:
Thesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.Includes bibliographical references (leaf 40).
URI: http://hdl.handle.net/1721.1/9742
Keywords: Sloan School of Management, Electrical Engineering and Computer Science

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