Three-dimensional super-resolution high-throughput imaging by structured illumination STED microscopy
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oe-26-16-20920.pdf
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3.97 MB
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Adobe PDF
Checksum (MD5)
7c960b28f414388765cd1469e9adc53d
Author(s)
Xue, Yi
So, Peter T. C.
Date Issued
July 2018
Journal
Optics Express
Publisher
Optical Society of America
Citation
Xue, Yi, and Peter T. C. So. “Three-Dimensional Super-Resolution High-Throughput Imaging by Structured Illumination STED Microscopy.” Optics Express 26, no. 16 (July 31, 2018): 20920.
Version
Final published version
Abstract
Stimulated emission depletion (STED) microscopy is able to image fluorescence labeled samples with nanometer scale resolution. STED microscopy is typically a point-scanning method, limited by the high intensity requirement of the depletion beam. With the development of high peak power lasers, two dimensional parallel STED microscopy has been developed. Here, we develop the theoretical basis for extending STED microscopy to three dimensional imaging in parallel. This method uses structured illumination (SI) to generates a three dimensional depletion pattern. Compared to the two dimensional parallel STED microscopy, the 3D SI-STED microscopy generates intensity modulation along the light propagation direction without requiring higher laser power. This method not only achieves axial super-resolution of STED microscopy but also greatly reduces photobleaching and photodamage for 3D volumetric imaging.
MIT Department
Massachusetts Institute of Technology. Department of Biological Engineering
Massachusetts Institute of Technology. Department of Mechanical Engineering
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1364/OE.26.020920
