Comparison of resonant inelastic x-ray scattering spectra and dielectric loss functions in copper oxides
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Kim-2009-Comparison of resona.pdf
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Author(s)
Kim, Jungho
Ellis, D. S.
Zhang, H.
Kim, Young-June
Hill, J. P.
Gog, T.
Casa, D.
Date Issued
March 2009
Journal
Physical review B
Publisher
American Physical Society
Citation
Kim, Jungho et al. “Comparison of Resonant Inelastic X-ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides.” Physical Review B 79.9 (2009) : n. pag. © 2009 The American Physical Society
Version
Final published version
Abstract
We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin-zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi2CuO4 [Bi subscript 2 CuO subscript 4], CuGeO3 [CuGeO subscript 3], Sr2Cu3O4Cl2 [Sr subscript 2 Cu subscript 3 O subscript 4 Dl subscript 2], La2CuO4 [La subscript 2 CuO subscript 4], and Sr2CuO2Cl2 [Sr subscript 2 CuO subscript 2 Cl subscript 2], and analyzed by considering both incident and scattered-photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi2CuO4 [Bi subscript 2 CuO subscript 4] and CuGeO3 [CuGeO subscript 3].
MIT Department
MIT Materials Research Laboratory
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DOI of Published Version
https://doi.org/10.1103/PhysRevB.79.094525
