A new model for electric force microscopy and its application for electrostatically generated phase difference in tapping mode AFM
Name
61463184-MIT.pdf
Description
Full printable version
Size
1.56 MB
Format
Adobe PDF
Checksum (MD5)
cd0846f97edc936c159083469c222e6f
Author(s)
Stone, Peter (Peter Robert)
Advisor(s)
Francisco Stellacci.
Alternative Title
New model for EFM microscopy and its application for electrostatically generated phase difference in tapping mode Atomic Force Microscope
Date Issued
2005
Publisher
Massachusetts Institute of Technology
Abstract
The harmonic force balance method was used to model and simulate electric force microscopy (EFM) and electrostatically generated phase difference in tapping mode AFM (EPTA) measurements. Simulations show that the harmonic force balance approach matches and explains EFM and EPTA experimental results well. Simulations also show that the model depended on both geometric and materials parameters. The harmonic force balance model was subsequently used to directly simulate a previously performed EPTA experiment. Data obtained from the model showed a remarkable similarity to the experimentally obtained data, thus validating the use of the harmonic force balance model to simulate EPTA data.
Description
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2005.
Includes bibliographical references (leaf 37).
Subjects
Materials Science and Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
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