Heavy Ion radiation assessment of a 100G/200G commercial optical coherent DSP ASIC
Name
1091011.pdf
Description
Published version
Size
1.69 MB
Format
Adobe PDF
Checksum (MD5)
6eeaa594b4222365c6327db391132fd7
Author(s)
Aniceto, Raichelle J.
Milanowski, Randall
McClure, Steve
Aguilar, Alexa
Moro, Slaven
Miller, Eric D.
Cahoy, Kerri
Nicholson, Neal
Greene, Daniel
Date Issued
March 4, 2019
Publisher
SPIE
Citation
Aniceto, Raichelle J., Milanowski, Randall, McClure, Steve, Aguilar, Alexa, Moro, Slaven et al. 2019. "Heavy Ion radiation assessment of a 100G/200G commercial optical coherent DSP ASIC."
Version
Final published version
Abstract
© 2019 SPIE. Downloading of the abstract is permitted for personal use only. We assess the viability of a state-of-the-art 100G/200G commercial optical coherent DSP ASIC (16 nm FinFET CMOS technology) for space applications through heavy ion testing to (1) screen for destructive SELs and (2) observe for nondestructive heavy ion SEEs on the ASIC. The ASIC was exposed to heavy ion radiation while operating both optically noise-loaded uplink and downlink to an optical and quot;ground" modem. There were no destructive SEEs, such as SELs, observed from the heavy ion radiation test campaign.
MIT Department
Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1117/12.2513244
