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  4. Large-area microwire MoSi single-photon detectors at 1550 nm wavelength

Large-area microwire MoSi single-photon detectors at 1550 nm wavelength

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sword-2020-12-02T15:24:35.original.xml (130 B)
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Author(s)
Charaev, I
•
Morimoto, Y
•
Dane, A
•
Agarwal, A
•
Colangelo, M
•
Berggren, KK
Date Issued
2020
Journal
Applied Physics Letters
Publisher
AIP Publishing
Version
Author's final manuscript
Abstract
© 2020 Author(s). We demonstrate saturated internal detection efficiency at 1550 nm wavelengths for meander-shaped superconducting nanowire single-photon detectors made of 3 nm thick MoSi films with widths of 1 and 3 μm and active areas up to 400 × 400 μm2. Despite hairpin turns and a large number of squares (up to 104) in the device, the dark count rate was measured to be ∼103 cps at 99% of the switching current. This value is about two orders of magnitude lower than the results reported recently for short MoSi devices with shunt resistors. We also found that 5 nm thick MoSi detectors with the same geometry were insensitive to single near-infrared photons, which may be associated with different levels of suppression of the superconducting order parameter. However, our results obtained on 3 nm thick MoSi devices are in good agreement with predictions in the frame of a kinetic-equation approach.
MIT Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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Creative Commons Attribution-Noncommercial-Share Alike
http://creativecommons.org/licenses/by-nc-sa/4.0/
Persistent DSpace Link
https://hdl.handle.net/1721.1/135323
DOI of Published Version
https://doi.org/10.1063/5.0005439
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