The effect of strain and orientation on Inx̳Ga₁₋x̳As layers grown by molecular beam epitaxy
Name
19283326-MIT.pdf
Description
Full printable version
Size
9.65 MB
Format
Adobe PDF
Checksum (MD5)
4fb79229a00d08c6bf2056e895104e3a
Author(s)
Elcess, Kimberley
Advisor(s)
Clifton G. Fonstad.
Date Issued
1988
Publisher
Massachusetts Institute of Technology
Description
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1988.
On t.p. all "x̳" is subscript.
Includes bibliographical references.
Subjects
Materials Science and Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
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