1/f noise in MOSFETs with ultrathin gate dielectrics
Name
26680871-MIT.pdf
Size
97.95 MB
Format
Adobe PDF
Checksum (MD5)
52a152c05c0f7f7d2e6481c49e5ea2d2
Author(s)
Gross, Blaine Jeffrey.
Date Issued
1992
Publisher
Massachusetts Institute of Technology
Description
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1992
Includes bibliographical references (p. 176-184).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.
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