The fusing mechanism of NiCr resistors in programmable read-only memory devices.

Kenney, George Brian

The fusing mechanism of NiCr resistors in programmable read-only memory devices.

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Author(s)

Kenney, George Brian

Advisor(s)

Robert E. Ogilvie.

Date Issued

1975

Publisher

Massachusetts Institute of Technology

Description

Thesis. 1975. M.S.--Massachusetts Institute of Technology. Dept. of Materials Science and Engineering.

Includes bibliographical references.

Subjects

Materials Science and Engineering

MIT Department

Massachusetts Institute of Technology. Department of Materials Science and Engineering

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