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  5. The fusing mechanism of NiCr resistors in programmable read-only memory devices.

The fusing mechanism of NiCr resistors in programmable read-only memory devices.

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Author(s)
Kenney, George Brian
Advisor(s)
Robert E. Ogilvie.
Date Issued
1975
Publisher
Massachusetts Institute of Technology
Description
Thesis. 1975. M.S.--Massachusetts Institute of Technology. Dept. of Materials Science and Engineering.
Includes bibliographical references.
Subjects
Materials Science and Engineering
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
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http://dspace.mit.edu/handle/1721.1/7582
Persistent DSpace Link
http://hdl.handle.net/1721.1/41570
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