Thickness Dependence of Oxygen Reduction Reaction Kinetics on Strontium-Substituted Lanthanum Manganese Perovskite Thin-Film Microelectrodes
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Shao-Horn_Thickness dependence.pdf
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Author(s)
La O', Gerardo Jose Cordova
Shao-Horn, Yang
Date Issued
March 2009
Journal
Electrochemical and Solid-State Letters
Publisher
Electrochemical Society
Citation
la O’, G. J., and Y. Shao-Horn. Thickness Dependence of Oxygen Reduction Reaction Kinetics on Strontium-Substituted Lanthanum Manganese Perovskite Thin-Film Microelectrodes. Electrochemical and Solid-State Letters 12, no. 5 (2009): B82. © 2009 by ECS -- The Electrochemical Society.
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Final published version
Abstract
Oxygen reduction reaction (ORR) kinetics was investigated on dense La₀.₈Sr₀.₂MnO₃ microelectrodes as a function of temperature and microelectrode thickness using electrochemical impedance spectroscopy. The surface oxygen exchange and mixed bulk/three-phase-boundary (TPB) charge transfer process were found to control ORR kinetics at high and low temperatures, respectively. The transition temperature from the mixed bulk/TPB charge transfer control to surface oxygen exchange was found to be highly dependent on the microelectrode thickness (~600degrees C for 65 nm vs ~800degreesC for 705 nm). These findings can be used to guide the design of electrodes that can operate at intermediate temperatures.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Massachusetts Institute of Technology. Electrochemical Energy Laboratory
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DOI of Published Version
https://doi.org/10.1149/1.3095681
