Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials
Name
1910.14195.pdf
Description
Submitted version
Size
958.23 KB
Format
Unknown
Checksum (MD5)
3a4c59d762f2aca9a4b933afd26c9042
Author(s)
Miller, Matthew J.
Cabral, Matthew J.
Dickey, Elizabeth C.
LeBeau, James M.
Reich, Brian J.
Date Issued
April 2021
Journal
Technometrics
Publisher
Informa UK Limited
Citation
Miller, Matthew J, Cabral, Matthew J, Dickey, Elizabeth C, LeBeau, James M and Reich, Brian J. 2022. "Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials." Technometrics, 64 (1).
Version
Original manuscript
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Terms of Use
Attribution-NonCommercial-ShareAlike 4.0 International
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1080/00401706.2021.1905070
