Wide-field two-photon microscopy with temporal focusing and HiLo background rejection
Author(s)
Yew, Elijah Y. S.
Choi, Heejin
Kim, Daekeun
So, Peter T. C.
Date Issued
January 2011
Journal
Proceedings of SPIE 7903, Multiphoton Microscopy in the Biomedical Sciences XI
Publisher
SPIE
Citation
Yew, Elijah Y. S., Heejin Choi, Daekeun Kim, and Peter T. C. So. “Wide-Field Two-Photon Microscopy with Temporal Focusing and HiLo Background Rejection.” Proceedings of SPIE 7903, Multiphoton Microscopy in the Biomedical Sciences XI, 22-27 January, 2011, San Francisco, California, USA, edited by Ammasi Periasamy, Karsten König, and Peter T. C. So., SPIE, 2011.
Version
Final published version
Abstract
Scanningless depth-resolved microscopy is achieved through spatial-temporal focusing and has been demonstrated previously. The advantage of this method is that a large area may be imaged without scanning resulting in higher throughput of the imaging system. Because it is a widefield technique, the optical sectioning effect is considerably poorer than with conventional spatial focusing two-photon microscopy. Here we propose wide-field two-photon microscopy based on spatio-temporal focusing and employing background rejection based on the HiLo microscope principle. We demonstrate the effects of applying HiLo microscopy to widefield temporally focused two-photon microscopy.
MIT Department
Institute for Medical Engineering and Science
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1117/12.876068
