Wide-field structured illumination microscopy for fluorescence and pump-probe imaging
Name
1102058096-MIT.pdf
Size
14.82 MB
Format
Adobe PDF
Checksum (MD5)
54e14e9ea7fa55ded2b801ee08048c10
Author(s)
Kim, Yang-Hyo.
Advisor(s)
Peter T. C. So.
Date Issued
2019
Publisher
Massachusetts Institute of Technology
Abstract
The optical resolution of microscopy is limited by the wave-like characteristic of the light. There are many recent advances in overcoming this diffraction limited resolution, but mostly focused on fluorescent imaging. Furthermore, there are few non-fluorescence wide-field super-resolution techniques that can fully utilize the applicable laser power to optimize imaging speed. Structured illumination microscopy is a super-resolution method that relies on patterned excitation. This thesis has presented novel applications of structured illumination microscopy to surface plasmon resonance fluorescence and pump-probe scattering imaging. First, structured illumination microscopy was introduced to surface plasmon resonance fluorescence imaging for high signal-to-noise and high resolution. Secondly, a theoretical framework for three-dimensional wide-field pump-probe structured illumination microscopy has been developed to increase the lateral resolution and enable depth sectioning. Further, structured illumination wide-field photothermal digital phase microscopy is proposed as a high throughput, high sensitivity super-resolution imaging tool to diagnose ovarian cancer. Finally, I have derived the exact analytical solution to the heat conduction problem in which a sphere absorbs temporally modulated laser beam for photothermal microscopy. The proposed method also has a great potential to be applied to other pump-probe modalities such as transient absorption and stimulated Raman scattering.
Description
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2019
Cataloged from PDF version of thesis.
Includes bibliographical references.
Subjects
Mechanical Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
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