Sampling-Based Sweep Planning to Exploit Local Planarity in the Inspection of Complex 3d Structures
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Englot_Hover_IROS_2012 Final Low-Res.pdf
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495.54 KB
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Author(s)
Englot, Brendan J.
Hover, Franz S.
Date Issued
October 2012
Journal
Proceedings of IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2012
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Englot, Brendan and Franz S. Hover. "Sampling-Based Sweep Planning to Exploit Local Planarity in the Inspection of Complex 3d Structures." IEEE/RSJ International Conference on Intelligent Robots and Systems, October 7-12, 2012, Vilamoura, Algarve, Portugal.
Version
Author's final manuscript
Abstract
We present a hybrid algorithm that plans feasible paths for 100% sensor coverage of complex 3D structures. The structures to be inspected are segmented to isolate planar areas, and back-and-forth sweep paths are generated to view as much of these planar areas as possible while avoiding collision. A randomized planning procedure fills in the remaining gaps in coverage. The problem of selecting an order to traverse the elements of the inspection is solved by reduction to the traveling salesman problem. We present results of the planning algorithm for an autonomous underwater vehicle inspecting the in-water portion of a ship hull. The randomized configurations succeed in observing confined and occluded areas, while the 2D sweep paths succeed in covering the open areas.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike
Persistent DSpace Link
DOI of Published Version
http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=06386126
