A data-driven approach to improving capacity utilization of semiconductor test equipment

Bailey, Roberta L. (Roberta Lynn)

A data-driven approach to improving capacity utilization of semiconductor test equipment

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Author(s)

Bailey, Roberta L. (Roberta Lynn)

Advisor(s)

Charles Sodini, Stephen Graves.

Date Issued

1996

Publisher

Massachusetts Institute of Technology

Description

Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996.

Includes bibliographical references (p. 77).

Subjects

Sloan School of Management

MIT Department

Sloan School of Management

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M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

http://dspace.mit.edu/handle/1721.1/7582

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http://hdl.handle.net/1721.1/10567