Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector
Name
diffshift.pdf
Description
Accepted version
Size
1.54 MB
Format
Adobe PDF
Checksum (MD5)
a9f47dd6f4a8af52eb081a276ae268aa
Author(s)
Chen, Xi
Hauwiller, Matthew R
Kumar, Abinash
Lebeau, James M
Date Issued
August 2020
Journal
Microscopy and Microanalysis
Publisher
Cambridge University Press (CUP)
Citation
Chen, Xi et al. “Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector.” Microscopy and Microanalysis, 11, (August 2020): 1-6 © 2020 The Author(s)
Version
Author's final manuscript
Abstract
We report an approach to expand the effective number of pixels available to small, two-dimensional electron detectors. To do so, we acquire subsections of a diffraction pattern that are then accurately stitched together in post-processing. Using an electron microscopy pixel array detector (EMPAD) that has only 128 × 128 pixels, we show that the field of view can be expanded while achieving high reciprocal-space sampling. Further, we highlight the need to properly account for the detector position (rotation) and the non-orthonormal diffraction shift axes to achieve an accurate reconstruction. Applying the method, we provide examples of spot and convergent beam diffraction patterns acquired with a pixelated detector.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1017/s1431927620024277
