Development and performance-testing of Multi-Path I/O algorithms on V-Series systems
Name
871035814-MIT.pdf
Description
Full printable version
Size
3.83 MB
Format
Adobe PDF
Checksum (MD5)
22eff445ad9691868651bd8119fc05f9
Author(s)
TerBush, Ryan (Ryan T.)
Advisor(s)
Christopher Terman and Chris Busick.
Date Issued
2013
Publisher
Massachusetts Institute of Technology
Abstract
As data growth continues to accelerate, so must performance and efficiency of large scale storage systems. This project will present the implementation and performance analysis of Multi-Path I/O within Data ONTAP. The goal of this feature is to take advantage of redundant paths that were previously utilized only in failure situations. The paper will address the core mechanisms that comprise the MPIO handling within the system. Furthermore it will present the difficulties of testing such a feature in a shared lab environment. The initial expectation that MPIO would provide a small performance gain, in addition to better failure handling properties, was affirmed in the results. Under heavy I/O loads, MPIO systems showed an average of 5% throughput improvement over the older single-path implementation.
Description
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2013.
Cataloged from PDF version of thesis.
Includes bibliographical references (page 52).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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