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Ultralow-Temperature Measurements of Submicron Devices

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RLE_PR_129_11.pdf

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Author(s)
Kastner, Marc A.
•
Field, S.
•
Licini, C.
•
Face, D.
•
Meirav, U.
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Scott-Thomas, John H. F.
•
Park, S.
Date Issued
January 1987
Publisher
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Series/Report no.
Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 129
Description
Contains research summary.
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Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.
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